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IEC 60749-7 Ed. 3.0 en:2025

IEC 60749-7 Ed. 3.0 en:2025

IEC 60749-7 Ed. 3.0 en:2025 HistoricalSemiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases

standard byInternational Electrotechnical Commission , 11/01/2025

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IEC 60749-7:2025 specifies the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. The test is used as a measure of the quality of the sealing process and to provide information about the long-term chemical stability of the atmosphere inside the package. It is applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace.
Of particular interest is the measurement of the primary sealing gases (or lack thereof), the moisture content, the presence of bombing gases that are indicative of non-hermeticity (e.g. helium), oxygen to argon ratio indicative of room air ~ 20 to 1 (± 10 %), dissimilar concentration of internally sealed gases (e.g. nitrogen, helium) than originally sealed in the device package, the presence of leak test fluid (i.e. fluorocarbon, helium, air), and all other gases to determine if the device meets the specified moisture, hermeticity and other criteria. Also of interest is the measurement of all the other gases since they reflect upon the quality of the sealing process and provide information about the long-term chemical stability of the atmosphere inside the device. The presence of leak test fluorocarbon vapour in the internal gas analysis (IGA) is an indication of failure to meet leak test requirements of IEC 60749-8.
This test is destructive.

Product Details

Edition:

3.0

Published:

11/01/2025

ISBN(s):

9782832708675

Number of Pages:

16

File Size:

1 file , 267 Bytes

Note:

This product is restricted and cannot be purchased in the following countries Ukraine, Russia, Belarus

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