IEC 60749-23 Ed. 2.0 en:2025
IEC 60749-23 Ed. 2.0 en:2025 HistoricalSemiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
standard byInternational Electrotechnical Commission , 12/01/2025
IEC 60749-23:2025 This part of IEC 60749 specifies the test used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way and is primarily for device qualification and reliability monitoring. A form of high temperature bias life using a short duration, popularly known as "burn-in", can be used to screen for infant-mortality related failures. The detailed use and application of burn-in is outside the scope of this document.
Product Details
Edition:
2.0Published:
12/01/2025ISBN(s):
9782832709030Number of Pages:
14File Size:
1 file , 327 BytesNote:
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